who now supply a comprehensive range of optical test equipment for metrology and production and are a key partner for us.
Armstrong Optical now specialise in a number of areas within advanced engineering, including a range of optical metrology solutions and electro-optics sub assemblies.
Our laser metrology instrumentation enables sub nm distance and high accuracy angle measurement for such apparatus as machine-tool beds; non-contact shape/thickness measurement of glass containers on production lines; non-contact vibration analysis – from the macro- right down to the micro-scale as well as bespoke automation of measurement requirements.
We are happy to offer either individual systems or complete tailored solutions to specific requirements and welcome as much dialogue with our customers as possible. So please feel free to
consortium) where he managed the highly successful INTERFIRE infrared interferometer business unit.
As well as looking after the interferometry and optical test equipment business areas, Ian’s main role is as Managing Director of Armstrong Optical.
Company Secretary & Office Manager
Angie deals with all the admin within the company and takes charge of the day to day running of the office.
or by clicking on the product image above.
or by clicking the product image above.
Regular Armstrong Optical e-Newsletter
It is our intention to issue e-Newsletters on a regular basis informing interested parties of our new products and services and news items such as exhibition attendance.
Simple and highly precise distance and layer thickness measurement of wafers and solar cells is provided by the sensors from the
product family. These optical sensors are capable of measuring silicon up to a thickness of 1mm with just one measuring head. The exact determination of thickness all the way into the edge area is very important for the highest quality.
family can measure even more; GaAs wafers, visually opaque plastic foils and multi-shift systems. The rugged, simple design of the optical sensors enables their easy integration directly into production processes. Naturally, the devices can also provide affordable and highly-precise layer thickness measurement in the laboratory.
Product recommendation: Product family
Armstrong Optical Contact CT gauge
The Contact CT Gauge from Armstrong Optical offers thickness measurements of upto 100mm with a standard diameter range of 300mm. Used for quick, accurate measurement of glass components this system incorporates 2 Heidenhain linear gauges mounted in opposition to each other. These are linked to a digital display which shows the difference between the 2 probes thus giving a direct reading of center thickness. The top gauge has a range of 25mm, resolution of 0.1μm and is movable to give access for thicker lenses. The bottom gauge has a range of 12mm, resolution of 0.1μm and is generally fixed. Both gauges have probe lifters attached so that the probes may be retracted allowing easy access for positioning of the lens prior to measurement. The table, mounted between the 2 gauges, is constructed of TUFSET plastic on an aluminium backing plate, offering robust construction along with a non-marking surface. The whole is mounted onto a granite base offering stability with low maintenance (corrosion free). For a non contact technical
